Electron beam in the context of "Klystron"

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⭐ Core Definition: Electron beam

Since the mid-20th century, electron-beam technology has provided the basis for a variety of novel and specialized applications in semiconductor manufacturing, microelectromechanical systems, nanoelectromechanical systems, and microscopy.

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Electron beam in the context of Direct current

Direct current (DC) is one-directional flow of electric charge. An electrochemical cell is a prime example of DC power. Direct current may flow through a conductor such as a wire, but can also flow through semiconductors, insulators, or even through a vacuum as in electron or ion beams. The electric current flows in a constant direction, distinguishing it from alternating current (AC). A term formerly used for this type of current was galvanic current.

The abbreviations AC and DC are often used to mean simply alternating and direct, as when they modify current or voltage.

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Electron beam in the context of Mechanical television

Mechanical television or mechanical scan television is an obsolete television system that relies on a mechanical scanning device, such as a rotating disk with holes in it or a rotating mirror drum, to scan the scene and generate the video signal, and a similar mechanical device at the receiver to display the picture. This contrasts with vacuum tube electronic television technology, using electron beam scanning methods, for example in cathode-ray tube (CRT) televisions. Subsequently, modern solid-state liquid-crystal displays (LCD) and LED displays are now used to create and display television pictures.

Mechanical scanning methods were used in the earliest experimental television systems in the 1920s and 1930s. One of the first experimental wireless television transmissions was by Scottish inventor John Logie Baird on October 2, 1925, in London. By 1928 many radio stations were broadcasting experimental television programs using mechanical systems. However, the technology never produced images of sufficient quality to become popular with the public. Mechanical-scan systems were largely superseded by electronic-scan technology in the mid-1930s, which was used in the first commercially successful television broadcasts that began in the late 1930s. In the U.S., experimental stations such as W2XAB in New York City began broadcasting mechanical television programs in 1931 but discontinued operations on February 20, 1933, until returning with an all-electronic system in 1939.

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Electron beam in the context of Length measurement

Length measurement, distance measurement, or range measurement (ranging) all refer to the many ways in which length, distance, or range can be measured. The most commonly used approaches are the rulers, followed by transit-time methods and the interferometer methods based upon the speed of light. Surveying is one ancient use of measuring long distances.

For tiny objects such as crystals and diffraction gratings, diffraction is used with X-ray light, or even electron beams. Measurement techniques for three-dimensional structures very small in every dimension use specialized instruments such as ion microscopy coupled with intensive computer modeling. These techniques are employed, for example, to measure the tiny features on wafers during the manufacture of chips.

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Electron beam in the context of Phosphor

A phosphor is a substance that exhibits the phenomenon of luminescence; it emits light when exposed to some type of radiant energy. The term is used both for fluorescent or phosphorescent substances which glow on exposure to ultraviolet or visible light, and cathodoluminescent substances which glow when struck by an electron beam (cathode rays) in a cathode-ray tube.

When a phosphor is exposed to radiation, the orbital electrons in its molecules are excited to a higher energy level; when they return to their former level they emit the energy as light of a certain color. Phosphors can be classified into two categories: fluorescent substances which emit the energy immediately and stop glowing when the exciting radiation is turned off, and phosphorescent substances which emit the energy after a delay, so they keep glowing after the radiation is turned off, decaying in brightness over a period of milliseconds to days.

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Electron beam in the context of Electron gun

An electron gun (also called electron emitter) is an electrical component in some vacuum tubes that produces a narrow, collimated electron beam that has a precise kinetic energy.

The largest use is in cathode-ray tubes (CRTs), used in older television sets, computer displays and oscilloscopes, before the advent of flat-panel displays. Electron guns are also used in field-emission displays (FEDs), which are essentially flat-panel displays made out of rows of extremely small cathode-ray tubes. They are also used in microwave linear beam vacuum tubes such as klystrons, inductive output tubes, travelling-wave tubes, and gyrotrons, as well as in scientific instruments such as electron microscopes and particle accelerators.

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Electron beam in the context of Lichtenberg figure

A Lichtenberg figure (German: Lichtenberg-Figur), or Lichtenberg dust figure, is a branching electric discharge that sometimes appears on the surface or in the interior of insulating materials. Lichtenberg figures are often associated with the progressive deterioration of high-voltage components and equipment. The study of planar Lichtenberg figures along insulating surfaces and 3D electrical trees within insulating materials often provides engineers with valuable insights for improving the long-term reliability of high-voltage equipment. Lichtenberg figures are now known to occur on or within solids, liquids, and gases during electrical breakdown.

Lichtenberg figures are natural phenomena that exhibit fractal properties.

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Electron beam in the context of Electron microprobe

Electron probe microanalysis (EPMA), also known as electron probe X-ray microanalysis, electron microprobe analysis (EMPA) or electron probe analysis (EPA) is a microanalytical and imaging technique used to non-destructively determine the chemical element composition of small volumes of solid materials. The device used for this technique is known as an electron probe microanalyzer (also abbreviated EPMA), often shortened to electron microprobe (EMP) or electron probe (EP).

In EPMA, the instrument bombards the sample with a high-intensity electron beam, which then emits X-rays. The X-ray wavelengths emitted are characteristic of particular chemical elements and are analyzed using X-ray spectroscopy. The same principle is also employed in wavelength- orenergy-dispersive X-ray spectroscopy (WDX, EDX) commonly used in scanning electron microscopes (SEM), but EPMA is characterized by a fixed electron beam rather than a scanning one and primarily used for elemental analysis rather than imaging.

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